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scan-in, scan-out


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scan-in, scan-out - Free On-line Dictionary of Computing (26 May 2007) :

  scan design
  Scan-In, Scan-Out
  
     <electronics> (Or "Scan-In, Scan-Out") A electronic circuit
     design technique which aims to increase the controllability
     and observability of a digital logic circuit by
     incorporating special "scan registers" into the circuit so
     that they form a scan path.
  
     Some of the more common types of scan design include the
     multiplexed register designs and level-sensitive scan design
      (LSSD) used extensively by IBM.  Boundary scan can
     be used alone or in combination with either of the above
     techniques.
  
     ["Digital Systems Testing and Testable Design" by Abramovici,
     Breuer, and Friedman, ISBN 0-7167-8179-4].
  
     ["Design of Testable Logic Circuits" by R.G. Bennetts,
     (Brunel/Southhampton Universities), ISBN 0-201-14403-4].
  
     (1995-02-23)